PSI - Issue 43

ScienceDirect Available online at www.sciencedirect.com ScienceDirect Structural Integrity Procedia 00 (2022) 000 – 000 Available online at www.sciencedirect.com Available online at www.sciencedirect.com ScienceDirect Structural Integrity Procedia 00 (2022) 000 – 000

www.elsevier.com/locate/procedia www.elsevier.com/locate/procedia

Procedia Structural Integrity 43 (2023) 288–293

© 2023 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (https://creativecommons.org/licenses/by-nc-nd/4.0) Peer-review under the responsibility of MSMF10 organizers. Abstract Impedance spectroscopy is a widely used analytical method in the material sciences that is used to study transport processes, the rate and properties of chemical reactions, corrosion, dielectric properties, microstructures and electrical conductivity in solids. The subject of the paper is a description of the possibilities of implementation the impedance spectroscopy method on the chip of a modern universal microcontroller with a minimum of external components using integrated microcontroller peripherals with the possibility of measuring material characteristics in the frequency range from 0.1 Hz to 300 kHz. The implementation on the ARM STM32L476 microcontroller chip is given as an example of miniaturization the presented concept intended for measuring material characteristics in-situ. © 20 23 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) Peer-review under the responsibility of MSMF10 organizers. 10th International Conference on Materials Structure and Micromechanics of Fracture Implementation of the impedance spectroscopy using a modern microcontroller Dagmar Faktorová a , Michal Kuba a , Soňa Pavlíková a , Peter Fabo a,1 a Faculty of Special Technology, Alexander Dubcek University of Trencin, Ku kyselke 469, 911 06 Trencin, Slovak Republic Abstract Imp dance spec rosco y is a widely used nalytical method n the mate al sciences that is used to tudy transport processes, he rate and properties of chemic l reactions, orrosion, di lectric properties, microstructures and el ctrical conductivit in soli s. The subject of the paper is a description of th possibilit es of impl m nt tion the impedance sp ct oscopy method n the chip of a modern universa microcontroller with a minimum of exter al components using integrated microcontroller peripherals with the possibility of measuring material characteristics in the frequency range from 0.1 Hz to 300 kHz. The implementatio o the ARM STM32L476 mi rocontroller chip is given as an example of miniaturization the presented concept intended for measuring material characteristics in-situ. © 20 23 The Authors. Published by Elsevier B.V. This is an ope access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) Peer-review under the responsibility of MSMF10 organizers. 10th International Conference on Materials Structure and Micromechanics of Fracture Implementation of the impedance spectroscopy using a modern microcontroller Dagmar Faktorová a , Michal Kuba a , Soňa Pavlíková a , Peter Fabo a,1 a Faculty of Special Technology, Alexander Dubcek University of Trencin, Ku kyselke 469, 911 06 Trencin, Slovak Republic Keywords: impedance spectroscopy, microcontroler, direct digital synthesis, impedance measurement, data processing, in-situ measurement. Keywords: impedance spectroscopy, microcontroler, direct digital synthesis, impedance measurement, data processing, in-situ measurement. 1 Introduction Electrical impedance spectroscopy (EIS), see Barsoukov and Macdonald (2005), is a widely used experimental technique in non-destructive research of the properties of various types of materials in a large number of applications, such as monitoring the properties of electrochemical sources, see Bredar et al. (2020), biomedical and biological applications, see Kanoun (2018), inductive, capacitive and conductive sensors. The main areas of use the impedance spectroscopy in materials science are the determination of structural and mechanical properties of materials, see Raistrick (1986), the classification of magnetic, and non-magnetic materials 1 Introduction Electrical impedance sp ctroscopy (EIS), see Bars ukov and Macdonald (2005), is widely used ex erimental tec nique in n n-destructive research of the properties of various types of materials in a large number of applications, such as monitoring the properties of electrochemical sources, see Bredar et al. (2020), biomedical and biological applications, se Kano n (2018), in uctive, capacitive and conductive sensors. T e m in areas of use the impedance spectroscopy in materials science are the determi ation of structural and mechanical properties of materials, see Raistrick (1986), the classification of magnetic, and non-magnetic materials

1 * Corresponding author. Tel.: +421-32-7400-215. E-mail address: peter.fabo@tnuni.sk 1 * Corresponding au hor. Tel.: +421-32-7400-215. E-mail address: peter.fabo@tnuni.sk

2452-3216 © 2023 The Authors. Published by ELSEVIER B.V. This is an open access article under the CC BY-NC-ND license (https://creativecommons.org/licenses/by-nc-nd/4.0) Peer-review under the responsibility of MSMF10 organizers. 10.1016/j.prostr.2022.12.273 2452-3216 © 2023 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (https://creativecommons.org/licenses/by-nc-nd/4.0) Peer-review under the responsibility of MSMF10 organizers. 2452-3216 © 2023 The Authors. Published by Elsevier B.V. This is an ope access article under the CC BY-NC-ND license (https://creativecommons.org/licenses/by-nc-nd/4.0) Peer-review under the responsibility of MSMF10 organizers.