PSI- Issue 9

Alexandre Chmel et al. / Procedia Structural Integrity 9 (2018) 3–8 Chmel et al. / Structural Integrity Procedia 00 (2018) 000–000

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Fig. 1. PL spectra of polished and ground samples of ZnS ceramics produced by the HP (a), PVD (b), and CVD (c) methods.

A comparison of the spectra of polished and ground samples obtained by the CVD method evidenced almost full identity of both ones. The abrasive treatment did not result in noticeable distortion / degradation of the crystalline structure. Figure 2 shows the FL time series excited in the samples by a striker. The series consisted of two most intensive peaks followed by the decaying light generation. Two pronounced bursts of activity in ductile A II B VI semiconductors might be caused by the contributions from two processes in damaging materials that is the plastic deformation and the following breakage of interatomic bonds.