PSI - Issue 60

Rakesh Bhadra et al. / Procedia Structural Integrity 60 (2024) 149–164 Bhadra et al. / Structural Integrity Procedia 00 (2023) 000 – 000

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Table 1 provides descriptions of several relevant terms employed in ANSYS, specifically those represented in the contour plots during the preceding analysis and plots.

Table 1. Descriptions of some useful terms SEQV

Element solution of von Mises stress

DMX SMN SMX

Maximum deflection value Minimum stress values Maximum stress values

(i)

(ii)

(a)

(i)

(ii)

(b)

(i)

(ii)

(c) Fig.9. Contour plot of von Mises stresses at the end of the loading phase at an indentation depth of 0.78 nm with varying gradation parameters (a) γ e = +2, (b) γ e = 0, and (c) γ e = -2 nm (CNTs wall thickness constant i.e. 0.102 nm).