PSI - Issue 40

A. Barannikov et al. / Procedia Structural Integrity 40 (2022) 40–45 A. Barannikov at al. / Structural Integrity Procedia 00 (2022) 000 – 000

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radiation energy equal to 12.4 keV was selected by a cryogenically cooled Si (111) double-crystal monochromator (Δ E/E~10 -4 ). It was installed at a distance of 35.8 m from the undulator and 21.2 m from the sample stage.

Fig.2. Experimental layout for the deformation field mapping of the X-ray silicon Fresnel Zone Plate.

The FZP was studied in 220 reflection in Laue geometry. To satisfy the Bragg-law for this radiation energy the FZP was rotated on the diffraction angle 2θ equal to 30.2 0 . The images of the Bragg reflections were recorded on the CCD camera with 0.64 μm pixel size placed at a distance of 20 cm behind the FZP. The optical scheme is presented in Fig. 2.

Fig. 3. (a) Stereo images with isolines recorded during the FZP rotation at the different angles ±Δθ . (b) Contour map obtained by the summation of the stereo images. (c) The horizontal deformation profiles of the FZP reconstructed at different positions.