PSI - Issue 23

Barbara Nasiłowska et al. / Procedia Structural Integrity 23 (2019) 583 –588 Nasiłowska B. / Structural Integrity Procedia 00 (2019) 000 – 000

586

4

a

a

b

b

Heat affected zone

WELD

27,16

3 μ m

500 μ m

Fig. 2. (a) heat affected zone in the joint made by the TIG method; (b) high-angle grain boundary

In result of double-sided shot peening of the tested elements the surface roughness increased: before shot-peening it was Ra = 8.812 µm, while after it Ra = 24.514 µm (Fig. 3).

a )

Base material

b

4. Analysis of the elemental composition of the surface layer

In-depth research of chemical composition of the upper layer was made using LIBS method. Acquisition of the stratigraphic LIBS spectra consisted in the execution of a certain number of laser cleaning pulses after which a proper pulse generated the plasma and its radiation spectrum was registered. On the basis of this LIBS spectrum a chemical composition at a certain layer depth was determined (Fig.4). In the

rid

face

1 mm

Fig. 3. Sample surface after upper layer shot peening

process of stainless (consisting of Cr~18%, Ni~10%, Si~1.8%, Mn~1.2%, Fe~69%) shot peening a transfer of microparticles coming from the stainless shot into the 5754 aluminium alloy surface down to the depth of 70 – 100 µm was observed. Below the selected fragments of LIBS spectrum taken in the upper layer from the depth of 1 µm with clear Ni, Fe, and Cr spectral line peaks coming from the shot (Fig.4a) and from the upper layer at the depth of about 70 – 100 µm. It should be noted that the intensity of Al spectral lines was the same for depths of 1 µm and 70 – 100 µm (Fig.4b).

a

b

 LIBS spectrum for 1 µm depth of the upper layer  LIBS spectrum for 70 - 100 µm depth of the upper layer

 LIBS spectrum for 1 µm depth of the upper layer  LIBS spectrum for 70 - 100 µm depth of the upper layer

Cr

Cr

Al

Al

Cr

Fe

Fe

Fe

Fe

Fe

Fe

Ni

Ni

Ni

Ni

Fig. 4. (a) fragments of LIBS spectrum of the aluminium alloy upper layer for the wavelengths of 350 – 365 nm and (b) for 307 – 310 nm

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