PSI - Issue 23

Available online at www.sciencedirect.com Available online at www.sciencedirect.com Available online at www.sciencedirect.com

ScienceDirect

Procedia Structural Integrity 23 (2019) 595–600 Structural Integrity Procedia 00 (2019) 000–000 Structural Integrity Procedia 00 (2019) 0–000

www.elsevier.com/locate/procedia www.elsevier.com/locate/procedia

2452-3216 © 2019 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) Peer-review under responsibility of the scientific committee of the ICMSMF organizers 10.1016/j.prostr.2020.01.151 ∗ Corresponding author. E-mail address: Nikola.Papez@vutbr.cz 2210-7843 c 2019 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) Peer-review under responsibility of the scientific committee of the IC MSMF organizers. 1. Introduction An important factor affecting the performance of all solar cells is their fabrication quality. The fabrication quality is influenced by various manufacturing processes, material purity or its type. Consequently, the performance and the rate of their degradation may vary depending upon time, temperature, radiation, and other influences. With constant efforts to increase the performance of solar cells, methods for precise locating the defects or imperfections are becoming increasingly important (Kleindiek et al. (2016)). In this work are then studied the influence of defects and imperfections on the function of the solar cell, the influence of ∗ Corresponding author. E-mail address: Nikola.Papez@vutbr.cz 2210-7843 c 2019 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) Peer-review under responsibility of the scientific committee of the IC MSMF organizers. © 2019 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) Peer-review under responsibility of the scientific committee of the ICMSMF organizers Abstract This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method. c 2019 The Authors. Published by Elsevier B.V. is is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) r-review und r re ponsibility of the scientific committee of the IC MSMF organizers. Keywords: ebic; structural analysis; solar cells; defects 9th International Conference on Materials Structure and Micromechanics of Fracture icrostructural investigation of defects in photovoltaic cells by the electron beam-induced current method Nikola Papeˇz a, ∗ , Rashid Dallaev a , Dinara Sobola a,b , Robert Mack˚u a , Pavel Sˇ karvada a a Department of Physics, Faculty of Electrical Engineering and Communications, Brno University of Technology, Technicka´ 2848/8, Brno, 61600, Czech Republic b Central European Institute of Technology, Purkynˇova 123, Brno, 61600, Czech Republic Abstract This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method. c 2019 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/) Peer-review under responsibility of the scientific committee of the IC MSMF organizers. Keywords: ebic; structural analysis; solar cells; defects 9th International Conference on Materials Structure and Micromechanics of Fracture Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method Nikola Papeˇz a, ∗ , Rashid Dallaev a , Dinara Sobola a,b , Robert Mack˚u a , Pavel Sˇ karvada a a Department of Physics, Faculty of Electrical Engineering and Communications, Brno University of Technology, Technicka´ 2848/8, Brno, 61600, Czech Republic b Central European Institute of Technology, Purkynˇova 123, Brno, 61600, Czech Republic 1. Introduction An important factor affecting the performance of all solar cells is their fabrication quality. The fabrication quality is influenced by various manufacturing processes, material purity or its type. Consequently, the performance and the rate of their degradation may vary depending upon time, temperature, radiation, and other influences. With constant efforts to increase the performance of solar cells, methods for precise locating the defects or imperfections are becoming increasingly important (Kleindiek et al. (2016)). In this work are then studied the influence of defects and imperfections on the function of the solar cell, the influence of