PSI - Issue 14

Sandeep Das et al. / Procedia Structural Integrity 14 (2019) 119–126 Sandeep Das et al. / Structural Integrity Procedia 00 (2018) 000–000

125

7

Table 3. Percentage of elements in various spectrums. Spectrum Al Ti Si

C

3

75.6

14.6

8.4

-

4

42.8

13.4

31.7

-

5 6

27.5 29.5

21.5

6.4 3.3

44.5 58.8

7.8

Fig. 6. Optical micrograph showing alloyed layer thickness of the specimen (I P 4A, T ON 536µs).

Fig. 7. Electron images of surface deposition, peak current (I P ) 4A, Pulse width (T ON ) 536 μs, Duty cycle 50%, Working time 5 min.