PSI - Issue 79

C. Vendittozzi et al. / Procedia Structural Integrity 79 (2026) 449–456

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Fig. 3 Raw data (wavelength of S1, S2, S3 and S4, in nm). Intermittent corruption observed during the flight on four gratings.

Fig. 4 Acquired data processed but still in nm (wavelength of S1, S2, S3 ane S4).