PSI - Issue 50
V.G. Degtiar et al. / Procedia Structural Integrity 50 (2023) 40–49 Author name / Structural Integrity Procedia 00 (2019) 000 – 000
43
4
Tsn k k k Ts
(4)
Tsp
where Tsp k – scatters due to different distributions of pores, shells, other defects, which are illustrated in Fig. 3, Degtiar et al. (2016), from the nominal.
Fig. 3. Electron micrographic shots of a sample of MKU-4M- 7 composite cut at 15° to the axial direction: (a) 50-fold increase; (b) 100-fold increase; (c) 300-fold increase; (d) 3000-fold increase. Designating indexes 1 and 2 to two slightly different values of density one can get
k
Тsn k k k Тsi
Vn P P P 1 Vi
,
1,2
a
a
i
Тspi
Тsn
i
n
Vn
k
n
Тsn
(5)
k
Тs k k k k 2 1 Тs
V P P P P 1
1
1
Тsp
Тsn
Vn
n
k
2
2
2
Тsp
Тsn
V
Vn
n
where – density parameter, the distribution of which over a TPS C-C composite element, taken by tomography, is given as initial data for computing ablated shapes. A rig implementing X-ray tomography in conical beams was used for tomography study. The COMET-450 X-ray unit with maximum voltage up to 450 keV was used as an emitter. A flat panel detector (the Perkin Elmers camera, 2048 х 2048 pixels, 0.2 х 0.2 mm 2 ) was utilized for detecting. An object (sample, piece) was put on a centering seat. The DELKEN-automazione system moved and circled the object ensuring the accuracy in height and concentricity no less than 0.01 mm. An aluminum compensator performed X-raying and reconstruction. The general view of a system getting projection data can be seen in Fig. 4.
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