Issue 15

P. F

. Fuchs et alii, F

rattura ed Integ

rità Strutturale,

15 (2011) 64-7

3; DOI: 10.3221

/IGF-ESIS.15.07

plo Pea fro loa can

tted over th rson’s r fact m the linear ding conditio be expected

e number of or, determin correlation, w n dependen to be reflect

drops until ed as 0.87, hich can be t material be ed in the BLC

failure in the supported th attributed t haviour on th BT.

BLDT. Th e method hy o the existing e other han

e plot is rev pothesis. Ho data scatter d, only signi

ealing a clear wever, beca on the one ficant differe

method cor use of existi hand and on nces in the B

relation and ng discrepan the unregar LDT behav

the cies ded iour

Figure

10 : Compariso Additional to

n of the BLDT the average v

and BLCBT alues the stand

set-up 1 resul ard deviations

ts for six PCB are indicated.

designs.

(a) 11 : Compariso design

(b) and b) the fa scopy.

n of a) the fai 1 in the BLCB

lure of design T, analyzed w

1 in the BLDT ith light micro

ilure of

Figure

(a) 12 : Compariso design rdance betw focused on d Fig. 12 the

(b) and b) the fa scopy. ern analysis the most p d failure loc

lure of design T, analyzed w and BLDT d 2, expect scopy image

n of a) the fai 2 in the BLCB een BLCBT designs 1 an light micro

2 in the BLDT ith light micro a failure patt ed to exhibit s of identifie

ilure of

Figure

Mo spe fail

reover, to ve cimens. The ure mode. In

rify the acco analysis was Fig. 11 an

was perform ronounced d ations are sh

ed on the te ifferences in own. The c

sted the ross

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